Environmental Fatigue-Crack Surface Crystallography for Al-Zn-Cu-Mg-Mn/Zr
The scanning electron microscope (SEM)–based electron backscattered diffraction (EBSD)/stereology technique quantitatively establishes distributions of the crystallographic characteristics of environmental-fatigue crack features for slightly overaged Al-Zn-Cu-Mg-X (X = Zr or Mn) alloys stressed in t...
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Veröffentlicht in: | Metallurgical and materials transactions. A, Physical metallurgy and materials science Physical metallurgy and materials science, 2008-06, Vol.39 (6), p.1449-1465 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The scanning electron microscope (SEM)–based electron backscattered diffraction (EBSD)/stereology technique quantitatively establishes distributions of the crystallographic characteristics of environmental-fatigue crack features for slightly overaged Al-Zn-Cu-Mg-X (X = Zr or Mn) alloys stressed in the low-growth-rate regime. Results for these homogeneous slip alloys conform to a substantial companion study of planar slip-prone Al-Cu-Mg/Li. Transgranular-crack characteristics are similar for the Mn and Zr variants, independent of grain size and recrystallization. Two morphologies of facetlike features exhibit a wide range of crystallographic orientations, change character at grain boundaries indicating an important role of grain orientation, and form in highly tensile-stressed spatial orientations about a crack tip. Similar characteristics for Al-Zn and Al-Cu suggest a common damage mechanism, speculatively attributed to hydrogen-environment embrittlement by decohesion. Slip-deformation band cracking resulting in facets near {111}, stimulated by H-enhanced localized plasticity, is not a viable mechanism for environmental fatigue. Repetitively stepped facets with surface curvature may involve H-enhanced cleavage along {100} or {110} planes subsequently distorted by plasticity. Broad-flat facets speculatively result from tensile stress-based cracking through dislocation cell structure, evolved by cyclic plasticity and containing trapped H. |
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ISSN: | 1073-5623 1543-1940 |
DOI: | 10.1007/s11661-008-9522-5 |