Characterization of the Bismuth-Based Piezoelectric Ceramic System (1-x)Bi(Mg1/2Zr1/2)O3-xPbTiO3

Dielectric properties and structural morphology of the Sc2O3 free and reduced lead content piezoelectric ceramic system, (1-x)Bi(Mg1/2Zr1/2)O3-xPbTiO3 (BMZ-xPT), were investigated in this study. The average grain size of the fresh fractured surfaces was of the order of ≤1 μm to ∼3 μm. The dielectric constant, loss tangent, Curie temperature, remnant polarization, coercive field, piezoelectric coefficient, and the planer coupling constant of ceramics in the vicinity of the morphotropic phase boundary (MPB) (x∼0.55) were, ∼1450, 0.0952, ∼553 K, 29 (μC/cm2) , 23 (kV/cm), ∼185 pC/N, and ∼30%, respectively. It was observed that with decreasing PbTiO3 contents the phase transition anomaly became broadened. The position of the dielectric constant maximum (ε′max) did not show any significant variation with probe frequency, exhibiting character of diffuse phase transition like many other disordered perovskites.