Very Low Temperature Electronic Transport in Al-Pd-Re Quasicrystalline Alloys
Electrical resistivities of two icosahedral (I) Al-Pd-Re alloys have been measured between room temperature and mK temperatures. One quasicrystalline (QC) polygrain Al-Pd-Re sample exhibited insulating behavior in its resistivities, increasing by a factor of r = R (4 K)/ R (300 K)=7.76; its room tem...
Gespeichert in:
Veröffentlicht in: | Journal of low temperature physics 2008, Vol.150 (1-2), p.82-100 |
---|---|
Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Electrical resistivities of two icosahedral (I) Al-Pd-Re alloys have been measured between room temperature and mK temperatures. One quasicrystalline (QC)
polygrain
Al-Pd-Re sample exhibited insulating behavior in its resistivities, increasing by a factor of
r
=
R
(4 K)/
R
(300 K)=7.76; its room temperature resistivity was 9,890 μΩ cm. A “phenomenological” expression fitted the conductivity data well between 300 K to 0.5 K. Below 0.4 K a crossover to an activated variable-range hopping law was observed. Low temperature magnetoresistance ratio data and fits using the wave function shrinkage theory are presented. A second QC Al-Pd-Re sample had a small resistance temperature ratio
r
=2.12. The room temperature resistivity was extremely large,
ρ
(300 K)≈40,980 μΩ cm. Its conductivity could be described well using a simple temperature power law between 300 K to 20 K. Below 20 K there was a crossover to a new behavior. Below 1 K, the conductivity could be fitted using a very weakly insulating power law where
σ
(
T
)≈11.37
T
0.032
in (Ω cm)
−1
, suggesting that this sample is located just below the metal-insulator transition. The magnetoconductivity data could not be fitted successfully using the 3D weak localization (WL) theory and inserting into it physical and realistic fitting magnitudes for the inelastic magnetic field
B
in
. |
---|---|
ISSN: | 0022-2291 1573-7357 |
DOI: | 10.1007/s10909-007-9518-3 |