Growth and structural properties of Zn1-xCrxTe crystals

Single crystals of Zn1-xCrxTe were grown by vapour phase growth method in the composition range of 0x0.005. Chemical analysis, surface morphology, structural and microhardness studies were carried out by EDAX, SEM, XRD and Vicker's indentation techniques, respectively. Microscopic variations be...

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Veröffentlicht in:	Journal of crystal growth 2008-01, Vol.310 (1), p.26-30
Hauptverfasser:	KRISHNAIAH, G, MADHUSUDHANA RAO, N, RAJA REDDY, D, REDDY, B. K, SREEDHARA REDDY, P
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Defects and impurities in crystals microstructure Exact sciences and technology Growth from vapor Inorganic compounds Linear defects: dislocations, disclinations Materials science Methods of crystal growth physics of crystal growth Physics Structure of solids and liquids crystallography Structure of specific crystalline solids Theory and models of crystal growth physics of crystal growth, crystal morphology and orientation
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Beschreibung
Zusammenfassung:	Single crystals of Zn1-xCrxTe were grown by vapour phase growth method in the composition range of 0x0.005. Chemical analysis, surface morphology, structural and microhardness studies were carried out by EDAX, SEM, XRD and Vicker's indentation techniques, respectively. Microscopic variations between the target and actual compositions were noticed. Morphology studies revealed that dislocation aided growth is active in the present crystals. XRD studies showed that samples of all compositions crystallized in zinc blende structure, and the lattice parameters varied linearly with x following Vegard's law. Vicker's hardness (Hv) decreased exponentially with x.
ISSN:	0022-0248 1873-5002
DOI:	10.1016/j.jcrysgro.2007.10.013