Effect of Zn/Si Ratio on the Microstructural and Microwave Dielectric Properties of Zn2SiO4 Ceramics

Zn2SiO4 ceramics synthesized by the conventional solid‐state method exhibited a low Q×f value, possibly due to the formation of a ZnO second phase. However, with a small ZnO reduction from the Zn2SiO4 ceramics, the ZnO second phase disappeared and grain growth occurred due to the formation of a Si‐r...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Journal of the American Ceramic Society 2007-10, Vol.90 (10), p.3127-3130
Hauptverfasser:	Nguyen, Ngoc-Huan, Lim, Jong-Bong, Nahm, Sahn, Paik, Jong-Hoo, Kim, Jong-Hee
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Building materials. Ceramics. Glasses Ceramic industries Chemical industry and chemicals Electrotechnical and electronic ceramics Exact sciences and technology Technical ceramics
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Zn2SiO4 ceramics synthesized by the conventional solid‐state method exhibited a low Q×f value, possibly due to the formation of a ZnO second phase. However, with a small ZnO reduction from the Zn2SiO4 ceramics, the ZnO second phase disappeared and grain growth occurred due to the formation of a Si‐rich liquid phase. Specimens with a large grain size exhibited an improved Q×f value. In particular, the ceramics with nominal composition Zn1.8SiO3.8 sintered at 1300°C exhibited improved microwave dielectric properties of ɛr=6.6, Q×f=147 000 GHz, and τf=−22 ppm/°C.
ISSN:	0002-7820 1551-2916
DOI:	10.1111/j.1551-2916.2007.01891.x