CMOS 2D Hall microsensor with minimal design complexity

A new silicon integrated 2D Hall sensor for high-accuracy magnetic-field in-plane vector measurements fabricated through a CMOS technology, has been suggested and tested. Its unique advantage is minimal design complexity: only four external connections, lack of cross-sensitivity between the channels...

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Veröffentlicht in:	Electronics letters 2007-04, Vol.43 (9), p.511-513
Hauptverfasser:	ROUMENIN, Ch. S, LOZANOVA, S. V
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Integrated circuits Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Online-Zugang:	Volltext
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