CMOS 2D Hall microsensor with minimal design complexity
A new silicon integrated 2D Hall sensor for high-accuracy magnetic-field in-plane vector measurements fabricated through a CMOS technology, has been suggested and tested. Its unique advantage is minimal design complexity: only four external connections, lack of cross-sensitivity between the channels...
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| Veröffentlicht in: | Electronics letters 2007-04, Vol.43 (9), p.511-513 |
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| container_end_page | 513 |
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| container_issue | 9 |
| container_start_page | 511 |
| container_title | Electronics letters |
| container_volume | 43 |
| creator | ROUMENIN, Ch. S LOZANOVA, S. V |
| description | A new silicon integrated 2D Hall sensor for high-accuracy magnetic-field in-plane vector measurements fabricated through a CMOS technology, has been suggested and tested. Its unique advantage is minimal design complexity: only four external connections, lack of cross-sensitivity between the channels and very high resolution. In addition, a simple, but highly effective circuitry fully compensates for the offsets and the nonlinear magnetoresistance of the two outputs. |
| doi_str_mv | 10.1049/el:20070784 |
| format | Article |
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V</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>CMOS 2D Hall microsensor with minimal design complexity</atitle><jtitle>Electronics letters</jtitle><date>2007-04-26</date><risdate>2007</risdate><volume>43</volume><issue>9</issue><spage>511</spage><epage>513</epage><pages>511-513</pages><issn>0013-5194</issn><eissn>1350-911X</eissn><coden>ELLEAK</coden><abstract>A new silicon integrated 2D Hall sensor for high-accuracy magnetic-field in-plane vector measurements fabricated through a CMOS technology, has been suggested and tested. Its unique advantage is minimal design complexity: only four external connections, lack of cross-sensitivity between the channels and very high resolution. 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| fulltext | fulltext |
| identifier | ISSN: 0013-5194 |
| ispartof | Electronics letters, 2007-04, Vol.43 (9), p.511-513 |
| issn | 0013-5194 1350-911X |
| language | eng |
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| source | Alma/SFX Local Collection |
| subjects | Applied sciences Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Integrated circuits Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
| title | CMOS 2D Hall microsensor with minimal design complexity |
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