Structural and dielectric properties of Pb(Zr,Ti)O3 heterolayered thick films

Ferroelectric PZT heterolayered thick films were fabricated by the alkoxide-based sol-gel method. PZT(30/70) and PZT(70/30) pastes were made and alternately screen-printed on the alumina substrates. The coating and drying procedure was repeated several times to form the heterolayered thick films. Th...

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Veröffentlicht in:	Journal of alloys and compounds 2008-01, Vol.449 (1-2), p.73-76, Article 73
Hauptverfasser:	LEE, Sung-Gap, SHIM, Young-Jae, KIM CHEOL JIN, CHUNG, Jun-Ki
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Dielectric loss and relaxation Dielectric properties of solids and liquids Dielectrics, piezoelectrics, and ferroelectrics and their properties Exact sciences and technology Permittivity (dielectric function) Physics
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Zusammenfassung:	Ferroelectric PZT heterolayered thick films were fabricated by the alkoxide-based sol-gel method. PZT(30/70) and PZT(70/30) pastes were made and alternately screen-printed on the alumina substrates. The coating and drying procedure was repeated several times to form the heterolayered thick films. The thickness of the films after one cycle of drying/coating was approximately 18mum. All PZT thick films showed the typical XRD patterns of a perovskite polycrystalline structure. The relative dielectric constant and the dielectric loss of the PZT-6 thick film were 1593 and 1.11%, respectively. And the PZT-6 film shows the remanent polarization of 19.4muC/cm2 and coercive field of 21.7kV/cm.
ISSN:	0925-8388 1873-4669
DOI:	10.1016/j.jallcom.2006.01.115