Enhanced Hole-Injecting Interface for High-Performance Deep-Blue Perovskite Light-Emitting Diodes Using Dipole-Controlled Self-Assembled Monolayers

The Blue electroluminescence (EL) with high brightness and spectral stability is imperative for full-color perovskite display technologies meeting the Rec. 2020 standard. However, deep-blue perovskite light-emitting diodes (PeLEDs) lag behind their green- or red-emitting counterparts in brightness,...

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Veröffentlicht in:Small (Weinheim an der Bergstrasse, Germany) Germany), 2024-11, Vol.21 (3), p.e2407769
Hauptverfasser: Lee, Hyo Jae, Do, Jung Jae, Jung, Jae Woong
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Sprache:eng
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Zusammenfassung:The Blue electroluminescence (EL) with high brightness and spectral stability is imperative for full-color perovskite display technologies meeting the Rec. 2020 standard. However, deep-blue perovskite light-emitting diodes (PeLEDs) lag behind their green- or red-emitting counterparts in brightness, quantum efficiency, and operational stability. Additionally, the Cl /Br mixed-halide perovskites with wide bandgap typically designed for deep-blue emitters are prone to degradation quickly under high operating bias due to low energy for halide migrations and vacancies formation, posing a significant challenge to spectral/operative stabilities. To address these issues, high-performance deep-blue PeLEDs are demonstrated by tuning the interface properties with Br-2ETP, a self-assembled monolayer (SAM) molecule engineered for a high dipole moment. The Br-2EPT-based hole-injecting interface facilitates favorable energy level alignment between indium tin oxide and the deep-lying valence band of the perovskite layer, suppressing the hole-injecting barrier and non-radiative charge recombination. Excellent perovskite film morphologies are observed at the top and buried surfaces by Br-2EPT, improving the balance of carrier injection for light emission efficiency. Consequently, the devices exhibit deep-blue electroluminescence at 457 nm, with an external quantum efficiency of 6.56% and spectral/operative stabilities.
ISSN:1613-6810
1613-6829
1613-6829
DOI:10.1002/smll.202407769