Ultra low-cost defect protection for microprocessor pipelines

The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Silicon failure mechanisms, such as transistor wearout and manufacturing defects, are a growing challenge that threatens the...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Shyam, Smitha, Constantinides, Kypros, Phadke, Sujay, Bertacco, Valeria, Austin, Todd
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Hardware > Hardware test Hardware > Robustness
Online-Zugang:	Volltext
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