Device relevant organic films and interfaces: A surface science approach

Here the morphology, molecular orientation and electronic structure of in situ prepared para-sexiphenyl (6P) and α-sexithiophene (6T) films studied with atomic force microscopy, near edge X-ray absorption fine structure spectroscopy and valence band photoemission are presented. Attention is given to...

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Veröffentlicht in:Surface science 2007-12, Vol.601 (24), p.5683-5689
Hauptverfasser: Koller, G., Berkebile, S., Ivanco, J., Netzer, F.P., Ramsey, M.G.
Format: Artikel
Sprache:eng
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Zusammenfassung:Here the morphology, molecular orientation and electronic structure of in situ prepared para-sexiphenyl (6P) and α-sexithiophene (6T) films studied with atomic force microscopy, near edge X-ray absorption fine structure spectroscopy and valence band photoemission are presented. Attention is given to the differences between different organic crystallite orientations and the pitfalls in the interpretation of area averaging surface sensitive techniques that can arise from inhomogeneities in the films, which commonly occur even on single crystal inorganic substrates. The growth of organic–organic heterostructures is then considered for sexithiophene films grown on homogeneous upright (6P(0 0 1)) and lying (6P(2 0 3)) crystalline films. In both cases, the orientation of the substrate molecules is imposed on the molecules of the second species and thick films of upright-on-upright or lying-on-lying could be produced. The organic substrates are thus shown to be excellent templates for further organic film growth that do not require the stringent UHV conditions of inorganic templates.
ISSN:0039-6028
1879-2758
DOI:10.1016/j.susc.2007.06.070