Low temperature RTP for BCB curing
Rapid thermal processing (RTP) applications are rapidly expanding from the original processes, typically performed above 1000 °C (e.g., post-implant annealing and silicon oxidation) to lower temperature applications such as cobalt and nickel silicide formation with process steps performed as low as...
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Veröffentlicht in: | Microelectronic engineering 2007-11, Vol.84 (11), p.2646-2652 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Rapid thermal processing (RTP) applications are rapidly expanding from the original processes, typically performed above 1000
°C (e.g., post-implant annealing and silicon oxidation) to lower temperature applications such as cobalt and nickel silicide formation with process steps performed as low as 200
°C. The original lamp-based (i.e., “cold wall”) RTP systems, despite their pyrometry-related issues, are
[1] still used, even in this low temperature regime. Another problem related to this approach occurs when processing materials exhibit significant outgassing, such as boron-phosphosilicate glass (BPSG). The outgassed vapour can condense on the cold chamber walls and change the light transmission characteristics of the quartz window. This can cause a process shift, uniformity change and will likely increase maintenance. In this paper, an alternative, hot wall approach, based on convection and conductive heat transfer is evaluated for low-temperature curing and annealing of benzocyclobutene (BCB) for high speed digital and microwave applications
[2]. |
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ISSN: | 0167-9317 1873-5568 |
DOI: | 10.1016/j.mee.2007.05.033 |