Thickness dependence of ferrimagnetic compensation in amorphous rare-earth transition-metal thin films
Magnetic compensation in ferrimagnets plays an important role in spintronic and magnetic recording devices. Experimental results have demonstrated a thickness dependence of the compensation temperature (Tcomp) in amorphous TbFeCo thin films. It was speculated that this thickness dependence originate...
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Veröffentlicht in: | Applied physics letters 2018-10, Vol.113 (17) |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Magnetic compensation in ferrimagnets plays an important role in spintronic and magnetic
recording devices. Experimental results have demonstrated a thickness dependence of the
compensation temperature (Tcomp) in amorphous TbFeCo thin films. It was
speculated that this thickness dependence originated from a variation in the short-range
order. In this work, we have investigated the depth-resolved compositional and
magnetization profiles using polarized neutron reflectometry. We find that although the
composition is uniform across the film thickness, near the substrate interface, the
magnetization exhibits a different temperature dependence from that of the rest of the
sample. Monte Carlo simulations show that it is this difference in interfacial
magnetization that causes the aforementioned thickness dependence of the compensation.
These results demonstrate the critical role of the substrate interface in determining the
magnetic properties of amorphous ferrimagnetic thin films for spintronic applications. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/1.5050626 |