Monolithic integration of perovskite heterojunction on TFT backplanes through vapor deposition for sensitive and stable x-ray imaging

Metal halide perovskites exhibit substantial potential for advancing next-generation x-ray detection. However, fabricating high-performance pixelated imaging arrays remains challenging due to the substantial dark current density and stability issues associated with common organic-inorganic hybrid pe...

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Veröffentlicht in:Science advances 2024-04, Vol.10 (17), p.eadj8659-eadj8659
Hauptverfasser: Li, Liqi, Tao, Liting, Wang, Lixiang, Li, Yuyang, Li, Jiawen, Ni, Zhenyi, Fang, Yanjun, Yang, Deren
Format: Artikel
Sprache:eng
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Zusammenfassung:Metal halide perovskites exhibit substantial potential for advancing next-generation x-ray detection. However, fabricating high-performance pixelated imaging arrays remains challenging due to the substantial dark current density and stability issues associated with common organic-inorganic hybrid perovskites. Here, we develop a vapor deposition method to create the first all-inorganic perovskite heterojunction film. The heterojunction introduction effectively reduces the dark current density of detectors to about 0.8 nA·cm , satisfying thin-film transistor (TFT) integration standards, while also increases sensitivity to above 2.6 × 10 μC·Gy ·cm , thus giving rise to a record low detection limit of
ISSN:2375-2548
2375-2548
DOI:10.1126/sciadv.adj8659