Monolithic integration of perovskite heterojunction on TFT backplanes through vapor deposition for sensitive and stable x-ray imaging
Metal halide perovskites exhibit substantial potential for advancing next-generation x-ray detection. However, fabricating high-performance pixelated imaging arrays remains challenging due to the substantial dark current density and stability issues associated with common organic-inorganic hybrid pe...
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Veröffentlicht in: | Science advances 2024-04, Vol.10 (17), p.eadj8659-eadj8659 |
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Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | Metal halide perovskites exhibit substantial potential for advancing next-generation x-ray detection. However, fabricating high-performance pixelated imaging arrays remains challenging due to the substantial dark current density and stability issues associated with common organic-inorganic hybrid perovskites. Here, we develop a vapor deposition method to create the first all-inorganic perovskite heterojunction film. The heterojunction introduction effectively reduces the dark current density of detectors to about 0.8 nA·cm
, satisfying thin-film transistor (TFT) integration standards, while also increases sensitivity to above 2.6 × 10
μC·Gy
·cm
, thus giving rise to a record low detection limit of |
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ISSN: | 2375-2548 2375-2548 |
DOI: | 10.1126/sciadv.adj8659 |