Carrier concentration dependence of critical fluctuation in La2-xSrxCuO4

We investigated the superconducting fluctuation effects of overdoped La2-xSrxCuO4 (LSCO) film with x=0.19 by the microwave conductivity measurement. Temperature and frequency dependences of the fluctuation-induced excess conductivity in the vicinity of Tc were analyzed using a dynamic scaling theory...

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Veröffentlicht in:Physica. C, Superconductivity Superconductivity, 2007-09, Vol.460-462 (2), p.906-907
Hauptverfasser: OHASHI, Takeyoshi, KITANO, Haruhisa, MAEDA, Atsutaka, TSUKADA, Ichiro
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Sprache:eng
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Zusammenfassung:We investigated the superconducting fluctuation effects of overdoped La2-xSrxCuO4 (LSCO) film with x=0.19 by the microwave conductivity measurement. Temperature and frequency dependences of the fluctuation-induced excess conductivity in the vicinity of Tc were analyzed using a dynamic scaling theory. We observed a two dimensional (2D) critical behavior of the fluctuation. Together with our previous work, the spatial dimension of the fluctuation does change from 2D (for underdoped LSCO) to 3D (for nearly optimally doped LSCO), and then, to 2D (for overdoped LSCO) as the carrier concentration increases.
ISSN:0921-4534
1873-2143
DOI:10.1016/j.physc.2007.03.271