Mapping Partially Recrystallised Structures by 3DXRD

A partially recrystallised sample has been characterised by 3DXRD. A gauge volume of 200μm × 700μm × 300μm has been fully mapped. Deformed and recrystallised regions within the selected gauge volume are distinguished based on the sharpness of the diffraction spots. Information corresponding to a 5D...

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Veröffentlicht in:	Materials science forum 2007-01, Vol.558-559, p.389-394
Hauptverfasser:	Soerensen, Henning O., Schmidt, Søren, Juul Jensen, Dorte, Knudsen, Erik, Winther, Grethe, West, S.S., Margulies, L.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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