Mapping Partially Recrystallised Structures by 3DXRD
A partially recrystallised sample has been characterised by 3DXRD. A gauge volume of 200μm × 700μm × 300μm has been fully mapped. Deformed and recrystallised regions within the selected gauge volume are distinguished based on the sharpness of the diffraction spots. Information corresponding to a 5D...
Gespeichert in:
| Veröffentlicht in: | Materials science forum 2007-01, Vol.558-559, p.389-394 |
|---|---|
| Hauptverfasser: | , , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Zusammenfassung: | A partially recrystallised sample has been characterised by 3DXRD. A gauge volume of
200μm × 700μm × 300μm has been fully mapped. Deformed and recrystallised regions within the
selected gauge volume are distinguished based on the sharpness of the diffraction spots. Information
corresponding to a 5D (Φ1, Φ, Φ2, z, x · y) map is deducted from the 3DXRD data. |
|---|---|
| ISSN: | 0255-5476 1662-9752 1662-9752 |
| DOI: | 10.4028/www.scientific.net/MSF.558-559.389 |