Local Defectivity Control of 2D Self-Assembled Block Copolymer Patterns
Surface patterning of copolymers via self‐assembly is achieved by substrate design. The figure shows a polystyrene‐block‐poly(methyl methacrylate) symmetric diblock copolymer confined in a tapered structure. Engineering the channel structure provides local defectivity control for defect‐free striped...
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Veröffentlicht in: | Advanced materials (Weinheim) 2007-08, Vol.19 (16), p.2157-2162 |
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creator | Ruiz, R. Ruiz, N. Zhang, Y. Sandstrom, R. L. Black, C. T. |
description | Surface patterning of copolymers via self‐assembly is achieved by substrate design. The figure shows a polystyrene‐block‐poly(methyl methacrylate) symmetric diblock copolymer confined in a tapered structure. Engineering the channel structure provides local defectivity control for defect‐free striped lamellar patterns at the nanometer scale. |
doi_str_mv | 10.1002/adma.200602470 |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_30091130</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>30091130</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4240-2117720d413b0973de27b49dd3b3f28396e35dca0cdd72c8a8c0da4c2f7b8a8c3</originalsourceid><addsrcrecordid>eNqFkD1PwzAQQC0EEqWwMmdiSznbSRyPpYWAVD7Eh2CzHNuRQp262CmQf0-qoIqN6XTSeyfdQ-gUwwQDkHOpGzkhABmQhMEeGuGU4DgBnu6jEXCaxjxL8kN0FMI7APAMshEqFk5JG81NZVRbf9ZtF83cqvXORq6KyDx6MraKpyGYprRGRxfWqWWPrJ3tGuOjB9m2xq_CMTqopA3m5HeO0cvV5fPsOl7cFzez6SJWCUkgJhgzRkAnmJbAGdWGsDLhWtOSViSnPDM01UqC0poRlctcgZaJIhUrtwsdo7Ph7tq7j40JrWjqoIy1cmXcJgjaP4YxhR6cDKDyLgRvKrH2dSN9JzCIbS-x7SV2vXqBD8JXbU33Dy2m89vpXzce3Dq05nvnSr8UGaMsFa93hXjExeyNciLm9AeFzX06</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>30091130</pqid></control><display><type>article</type><title>Local Defectivity Control of 2D Self-Assembled Block Copolymer Patterns</title><source>Access via Wiley Online Library</source><creator>Ruiz, R. ; Ruiz, N. ; Zhang, Y. ; Sandstrom, R. L. ; Black, C. T.</creator><creatorcontrib>Ruiz, R. ; Ruiz, N. ; Zhang, Y. ; Sandstrom, R. L. ; Black, C. T.</creatorcontrib><description>Surface patterning of copolymers via self‐assembly is achieved by substrate design. The figure shows a polystyrene‐block‐poly(methyl methacrylate) symmetric diblock copolymer confined in a tapered structure. Engineering the channel structure provides local defectivity control for defect‐free striped lamellar patterns at the nanometer scale.</description><identifier>ISSN: 0935-9648</identifier><identifier>EISSN: 1521-4095</identifier><identifier>DOI: 10.1002/adma.200602470</identifier><language>eng</language><publisher>Weinheim: WILEY-VCH Verlag</publisher><subject>Block copolymers ; Epitaxial growth ; Nanofabrication ; Self-assembly ; Surface patterning</subject><ispartof>Advanced materials (Weinheim), 2007-08, Vol.19 (16), p.2157-2162</ispartof><rights>Copyright © 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4240-2117720d413b0973de27b49dd3b3f28396e35dca0cdd72c8a8c0da4c2f7b8a8c3</citedby><cites>FETCH-LOGICAL-c4240-2117720d413b0973de27b49dd3b3f28396e35dca0cdd72c8a8c0da4c2f7b8a8c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fadma.200602470$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fadma.200602470$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>315,781,785,1418,27926,27927,45576,45577</link.rule.ids></links><search><creatorcontrib>Ruiz, R.</creatorcontrib><creatorcontrib>Ruiz, N.</creatorcontrib><creatorcontrib>Zhang, Y.</creatorcontrib><creatorcontrib>Sandstrom, R. L.</creatorcontrib><creatorcontrib>Black, C. T.</creatorcontrib><title>Local Defectivity Control of 2D Self-Assembled Block Copolymer Patterns</title><title>Advanced materials (Weinheim)</title><addtitle>Adv. Mater</addtitle><description>Surface patterning of copolymers via self‐assembly is achieved by substrate design. The figure shows a polystyrene‐block‐poly(methyl methacrylate) symmetric diblock copolymer confined in a tapered structure. Engineering the channel structure provides local defectivity control for defect‐free striped lamellar patterns at the nanometer scale.</description><subject>Block copolymers</subject><subject>Epitaxial growth</subject><subject>Nanofabrication</subject><subject>Self-assembly</subject><subject>Surface patterning</subject><issn>0935-9648</issn><issn>1521-4095</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNqFkD1PwzAQQC0EEqWwMmdiSznbSRyPpYWAVD7Eh2CzHNuRQp262CmQf0-qoIqN6XTSeyfdQ-gUwwQDkHOpGzkhABmQhMEeGuGU4DgBnu6jEXCaxjxL8kN0FMI7APAMshEqFk5JG81NZVRbf9ZtF83cqvXORq6KyDx6MraKpyGYprRGRxfWqWWPrJ3tGuOjB9m2xq_CMTqopA3m5HeO0cvV5fPsOl7cFzez6SJWCUkgJhgzRkAnmJbAGdWGsDLhWtOSViSnPDM01UqC0poRlctcgZaJIhUrtwsdo7Ph7tq7j40JrWjqoIy1cmXcJgjaP4YxhR6cDKDyLgRvKrH2dSN9JzCIbS-x7SV2vXqBD8JXbU33Dy2m89vpXzce3Dq05nvnSr8UGaMsFa93hXjExeyNciLm9AeFzX06</recordid><startdate>20070817</startdate><enddate>20070817</enddate><creator>Ruiz, R.</creator><creator>Ruiz, N.</creator><creator>Zhang, Y.</creator><creator>Sandstrom, R. L.</creator><creator>Black, C. T.</creator><general>WILEY-VCH Verlag</general><general>WILEY‐VCH Verlag</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20070817</creationdate><title>Local Defectivity Control of 2D Self-Assembled Block Copolymer Patterns</title><author>Ruiz, R. ; Ruiz, N. ; Zhang, Y. ; Sandstrom, R. L. ; Black, C. T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4240-2117720d413b0973de27b49dd3b3f28396e35dca0cdd72c8a8c0da4c2f7b8a8c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Block copolymers</topic><topic>Epitaxial growth</topic><topic>Nanofabrication</topic><topic>Self-assembly</topic><topic>Surface patterning</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ruiz, R.</creatorcontrib><creatorcontrib>Ruiz, N.</creatorcontrib><creatorcontrib>Zhang, Y.</creatorcontrib><creatorcontrib>Sandstrom, R. L.</creatorcontrib><creatorcontrib>Black, C. T.</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Advanced materials (Weinheim)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ruiz, R.</au><au>Ruiz, N.</au><au>Zhang, Y.</au><au>Sandstrom, R. L.</au><au>Black, C. T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Local Defectivity Control of 2D Self-Assembled Block Copolymer Patterns</atitle><jtitle>Advanced materials (Weinheim)</jtitle><addtitle>Adv. Mater</addtitle><date>2007-08-17</date><risdate>2007</risdate><volume>19</volume><issue>16</issue><spage>2157</spage><epage>2162</epage><pages>2157-2162</pages><issn>0935-9648</issn><eissn>1521-4095</eissn><abstract>Surface patterning of copolymers via self‐assembly is achieved by substrate design. The figure shows a polystyrene‐block‐poly(methyl methacrylate) symmetric diblock copolymer confined in a tapered structure. Engineering the channel structure provides local defectivity control for defect‐free striped lamellar patterns at the nanometer scale.</abstract><cop>Weinheim</cop><pub>WILEY-VCH Verlag</pub><doi>10.1002/adma.200602470</doi><tpages>6</tpages></addata></record> |
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subjects | Block copolymers Epitaxial growth Nanofabrication Self-assembly Surface patterning |
title | Local Defectivity Control of 2D Self-Assembled Block Copolymer Patterns |
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