S and Te inter-diffusion in CdTe/CdS hetero junction

Effects of post formation thermal annealing of the CdTe–CdS device on the inter-diffusion of S and Te at the junction in a substrate configuration device have been studied by Auger electron spectroscopy. While the migration of S and Te atoms increases with annealing temperature, the extent of S diff...

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Veröffentlicht in:Solar energy materials and solar cells 2007-09, Vol.91 (15), p.1392-1397
Hauptverfasser: Enríquez, J. Pantoja, Gómez Barojas, E., Silva González, R., Pal, U.
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container_issue 15
container_start_page 1392
container_title Solar energy materials and solar cells
container_volume 91
creator Enríquez, J. Pantoja
Gómez Barojas, E.
Silva González, R.
Pal, U.
description Effects of post formation thermal annealing of the CdTe–CdS device on the inter-diffusion of S and Te at the junction in a substrate configuration device have been studied by Auger electron spectroscopy. While the migration of S and Te atoms increases with annealing temperature, the extent of S diffusion is always higher than the diffusion of Te atoms. Inter-diffusion of S and Te causes the formation of CdTe 1 - x S x ternary compound at the CdTe–CdS interface.
doi_str_mv 10.1016/j.solmat.2007.05.008
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subjects AES
Applied sciences
CdS
CdTe
CdTe/CdS
Energy
Equipments, installations and applications
Exact sciences and technology
Inter-diffusion
Natural energy
Photovoltaic conversion
Solar energy
title S and Te inter-diffusion in CdTe/CdS hetero junction
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