XPS Studies on Composite ZrO2-CeO2 Thin Films Deposited on Metal Substrate by Sol-Gel

The influence of heat-treated temperature and the CeO2 content on the chemical composition and the valence state of elements on surface of ZrO2-CeO2 thin films deposited on metal substrates has been studied by X-ray photoelectron spectroscopy. Results show that: elements of Fe, Cr, Zr, Ce exist in the form of their respective stable state, such as Fe2O3, (Fe0.6Cr0.4)O3, ZrO2, CeO2, when heat treated at 600°C and 700°C for 2h respectively; with the increase of heat-treated temperature, the area of oxygen with O1s peak corresponding to value of bonding energy 529.28ev increases, but the area of oxygen with O1s peak corresponding to value of bonding energy 531.7ev decreases.