Characterization of boron carbon nitride film for humidity sensor
Boron carbon nitride films are synthesized in a horizontal quartz reactor by plasma-assisted chemical vapor deposition. Boron trichloride (BCl 3), nitrogen (N 2) and methane (CH 4) are used as source gases. Plasma of N 2 and CH 4 is produced by supplying RF power to the turn coil. BCl 3 is transport...
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Veröffentlicht in: | Diamond and related materials 2007-04, Vol.16 (4), p.1300-1303 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Boron carbon nitride films are synthesized in a horizontal quartz reactor by plasma-assisted chemical vapor deposition. Boron trichloride (BCl
3), nitrogen (N
2) and methane (CH
4) are used as source gases. Plasma of N
2 and CH
4 is produced by supplying RF power to the turn coil. BCl
3 is transported near the substrate by H
2 gas. The substrate temperature is kept at 730 °C. The BCN film with B, C, N and O composition ratios of 43%, 30%, 24% and 3% is characterized. Thermal desorption spectroscopy (TDS) measurement is carried out for the BCN film treated with D
2O. Desorption of D
2O from the BCN film occurs at 230 °C, 420 °C and 730 °C. Desorption of D
2 also occurs at 750 °C. The impedance of the as-deposited and water-treated BCN films is investigated by ac measurement. The impedance of the as-deposited BCN film depends on the −
0.9 power law of the frequency. On the other hand, the impedance of the water-treated BCN film decreases in the frequency range lower than 10
4 Hz. This is because another electrical conduction other than the quantum-mechanical tunneling hopping conduction becomes dominant due to water incorporation into the BCN film. |
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ISSN: | 0925-9635 1879-0062 |
DOI: | 10.1016/j.diamond.2007.01.014 |