Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon
The infrared reflectance spectra at normal incidence for split-ring resonator arrays fabricated in thin films of three different metals on a silicon substrate are reported. The results are compared with a finite difference time domain simulation of the structures and a simple and novel equivalent-ci...
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| Veröffentlicht in: | Electronics letters 2006-09, Vol.42 (19), p.1117-1119 |
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| container_end_page | 1119 |
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| container_issue | 19 |
| container_start_page | 1117 |
| container_title | Electronics letters |
| container_volume | 42 |
| creator | JOHNSON, N. P KHOKHAR, A. Z CHONG, H. M. H DE LA RUE, R. M MCMEEKIN, S |
| description | The infrared reflectance spectra at normal incidence for split-ring resonator arrays fabricated in thin films of three different metals on a silicon substrate are reported. The results are compared with a finite difference time domain simulation of the structures and a simple and novel equivalent-circuit method for the calculation of the first and second resonant wavelengths. |
| doi_str_mv | 10.1049/el:20062212 |
| format | Article |
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| ispartof | Electronics letters, 2006-09, Vol.42 (19), p.1117-1119 |
| issn | 0013-5194 1350-911X |
| language | eng |
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| source | Alma/SFX Local Collection |
| subjects | Applied sciences Circuit properties Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Materials Oscillators, resonators, synthetizers |
| title | Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon |
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