Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon

Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon

The infrared reflectance spectra at normal incidence for split-ring resonator arrays fabricated in thin films of three different metals on a silicon substrate are reported. The results are compared with a finite difference time domain simulation of the structures and a simple and novel equivalent-ci...

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Veröffentlicht in:Electronics letters 2006-09, Vol.42 (19), p.1117-1119
Hauptverfasser: JOHNSON, N. P, KHOKHAR, A. Z, CHONG, H. M. H, DE LA RUE, R. M, MCMEEKIN, S
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Circuit properties
Electric, optical and optoelectronic circuits
Electronic circuits
Electronics
Exact sciences and technology
Materials
Oscillators, resonators, synthetizers
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Zusammenfassung:The infrared reflectance spectra at normal incidence for split-ring resonator arrays fabricated in thin films of three different metals on a silicon substrate are reported. The results are compared with a finite difference time domain simulation of the structures and a simple and novel equivalent-circuit method for the calculation of the first and second resonant wavelengths.
ISSN:0013-5194
1350-911X
DOI:10.1049/el:20062212