Fabrication and X-ray absorption spectroscopy in layered cobaltate NaxCoO2 thin films

Fabrication and X-ray absorption spectroscopy in layered cobaltate NaxCoO2 thin films

NaxCoO2 (x0.68) thin films were fabricated on sapphire (0001) substrates via the lateral diffusion of sodium into Co3O4 (111) films, which were grown by pulsed-laser deposition. From the results of X-ray diffraction and in-plane resistivity rhoab, the single phase and the metallic behaviors of these...

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Veröffentlicht in:Journal of magnetism and magnetic materials 2007-03, Vol.310 (2), p.e335-e336
Hauptverfasser: Chang, W.J., Lin, J.-Y., Chung, T.Y., Chen, J.M., Hsu, C.-H., Hsu, S.Y., Uen, T.M., Wu, K.H., Gou, Y.S., Juang, J.Y.
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Sprache:eng
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Zusammenfassung:NaxCoO2 (x0.68) thin films were fabricated on sapphire (0001) substrates via the lateral diffusion of sodium into Co3O4 (111) films, which were grown by pulsed-laser deposition. From the results of X-ray diffraction and in-plane resistivity rhoab, the single phase and the metallic behaviors of these NaxCoO2 films can be identified. For the same sodium content x, rhoab is consistent with that of single crystals. In addition, the O 1s X-ray absorption near edge spectra of thin films are measured and compared with those of single crystals.
ISSN:0304-8853
DOI:10.1016/j.jmmm.2006.10.301