Out-of-plane tilted Josephson junctions of bi-epitaxial YBa2Cu3Ox thin films on tilted-axes NdGaO3 substrates with CeO2 seeding layer

Bi-epitaxial heterostructures YBa2Cu3Ox(YBCO)/CeO2/NdGaO3 were prepared on tilted-axes NdGaO3 substrates using laser ablation technique. The heterostructures were patterned for electrical measurements using photolithography and ion-beam milling. Electrical anisotropy of the YBCO film was tested on t...

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Veröffentlicht in:	Physica. C, Superconductivity Superconductivity, 2006-03, Vol.435 (1-2), p.23-26
Hauptverfasser:	Mozhaev, Peter B., Mozhaeva, Julia E., Bdikin, Igor K., Kotelyanskii, Iosif M., Luzanov, Valery A., Zybtsev, Sergey G., Hansen, Jørn Bindslev, Jacobsen, Claus S.
Format:	Artikel
Sprache:	eng
Schlagworte:	Bi-epitaxial -tilt Josephson junctions Textured growth on a seeding layer
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	Bi-epitaxial heterostructures YBa2Cu3Ox(YBCO)/CeO2/NdGaO3 were prepared on tilted-axes NdGaO3 substrates using laser ablation technique. The heterostructures were patterned for electrical measurements using photolithography and ion-beam milling. Electrical anisotropy of the YBCO film was tested on the ion-beam etched surface. Bi-epitaxial junctions with four different orientations of the bi-epitaxial border were fabricated and studied. The measured IV curves showed flux–flow behavior with critical current density 2.5×104A/cm2 for the twist-type junctions and 1.5×103A/cm2 for [100]-tilt type junctions.
ISSN:	0921-4534 1873-2143
DOI:	10.1016/j.physc.2006.01.011