The effect of HVPE reactor geometry on GaN growth rate—experiments versus simulations

In the study, presented in this paper, the growth of GaN layers by Hydride vapour phase epitaxy was investigated both experimentally and numerically. Modelling the flows in the reactor, combined with basic chemistry, gives a good approximation to the actual growth experiments. It was found that smal...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of crystal growth 2004-10, Vol.271 (1-2), p.192-199
Hauptverfasser: Dam, C.E.C., Grzegorczyk, A.P., Hageman, P.R., Dorsman, R., Kleijn, C.R., Larsen, P.K.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:In the study, presented in this paper, the growth of GaN layers by Hydride vapour phase epitaxy was investigated both experimentally and numerically. Modelling the flows in the reactor, combined with basic chemistry, gives a good approximation to the actual growth experiments. It was found that small changes in the reactor geometry, e.g.the inlet of GaCl, have a large effect on the growth rate as well as on the uniformity of the growth.
ISSN:0022-0248
1873-5002
DOI:10.1016/j.jcrysgro.2004.07.059