Substrate temperature calculation for pulsed bias arc ion plating

The main factors influencing substrate temperature such as ion bombardment, heat radiation, and heat conductivity are analyzed for Pulsed-Bias Arc Ion Plating (PBAIP). The wave profile of the pulsed bias voltage, varying from −1000 to 0 V, is basically rectangle. This characteristic periodic energy...

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Veröffentlicht in:Surface & coatings technology 2005-05, Vol.194 (2), p.325-329
Hauptverfasser: Guoqiang, Lin, Xiao, Bai, Chuang, Dong, Lishi, Wen
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Xiao, Bai
Chuang, Dong
Lishi, Wen
description The main factors influencing substrate temperature such as ion bombardment, heat radiation, and heat conductivity are analyzed for Pulsed-Bias Arc Ion Plating (PBAIP). The wave profile of the pulsed bias voltage, varying from −1000 to 0 V, is basically rectangle. This characteristic periodic energy input has an average energy density being equal to the product of that of the DC Arc Ion Plating (DCAIP) and the duty cycle in PBAIP. A temperature model based on energy conservation for the substrate temperature is thus established, which incorporates input ion power, heat radiation and heat conductivity. Experiments are also conducted to verify the calculation.
doi_str_mv 10.1016/j.surfcoat.2004.07.074
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_29615331</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0257897204005973</els_id><sourcerecordid>29615331</sourcerecordid><originalsourceid>FETCH-LOGICAL-c445t-e5787d905f646e0801acf581b9574c74ebfbc1dfd5aaf94252c62ff619848f8c3</originalsourceid><addsrcrecordid>eNqFkEtLxDAQgIMouK7-BelFb61Jm-fNZfEFCx7Uc0jTiWTptjVpBf-9KbvicWFghplvZuBD6JrggmDC77ZFnIKzvRmLEmNaYJGCnqAFkULlVUXFKVrgkolcKlGeo4sYtxhjIhRdoNXbVMcxmBGyEXYDpGoKkFnT2qk1o--7zPUhG6Y2QpPV3sTMBJvN_WGed5-X6MyZNL065CX6eHx4Xz_nm9enl_Vqk1tK2ZgDE1I0CjPHKQcsMTHWMUlqxQS1gkLtaksa1zBjnKIlKy0vneNESSqdtNUS3e7vDqH_miCOeuejhbY1HfRT1KXihFUVOQ5KphKJE8j3oA19jAGcHoLfmfCjCdazWr3Vf2r1rFZjkYKmxZvDBxOTKRdMZ3383-ZcUVrKxN3vOUhevj0EHa2HzkLjA9hRN70_9uoXX9OTUQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>28591530</pqid></control><display><type>article</type><title>Substrate temperature calculation for pulsed bias arc ion plating</title><source>Access via ScienceDirect (Elsevier)</source><creator>Guoqiang, Lin ; Xiao, Bai ; Chuang, Dong ; Lishi, Wen</creator><creatorcontrib>Guoqiang, Lin ; Xiao, Bai ; Chuang, Dong ; Lishi, Wen</creatorcontrib><description>The main factors influencing substrate temperature such as ion bombardment, heat radiation, and heat conductivity are analyzed for Pulsed-Bias Arc Ion Plating (PBAIP). The wave profile of the pulsed bias voltage, varying from −1000 to 0 V, is basically rectangle. This characteristic periodic energy input has an average energy density being equal to the product of that of the DC Arc Ion Plating (DCAIP) and the duty cycle in PBAIP. A temperature model based on energy conservation for the substrate temperature is thus established, which incorporates input ion power, heat radiation and heat conductivity. Experiments are also conducted to verify the calculation.</description><identifier>ISSN: 0257-8972</identifier><identifier>EISSN: 1879-3347</identifier><identifier>DOI: 10.1016/j.surfcoat.2004.07.074</identifier><identifier>CODEN: SCTEEJ</identifier><language>eng</language><publisher>Lausanne: Elsevier B.V</publisher><subject>Arc ion plating ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Materials science ; Other topics in materials science ; Physics ; Pulsed bias ; Substrate temperature</subject><ispartof>Surface &amp; coatings technology, 2005-05, Vol.194 (2), p.325-329</ispartof><rights>2004 Elsevier B.V.</rights><rights>2005 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c445t-e5787d905f646e0801acf581b9574c74ebfbc1dfd5aaf94252c62ff619848f8c3</citedby><cites>FETCH-LOGICAL-c445t-e5787d905f646e0801acf581b9574c74ebfbc1dfd5aaf94252c62ff619848f8c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.surfcoat.2004.07.074$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=16694428$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Guoqiang, Lin</creatorcontrib><creatorcontrib>Xiao, Bai</creatorcontrib><creatorcontrib>Chuang, Dong</creatorcontrib><creatorcontrib>Lishi, Wen</creatorcontrib><title>Substrate temperature calculation for pulsed bias arc ion plating</title><title>Surface &amp; coatings technology</title><description>The main factors influencing substrate temperature such as ion bombardment, heat radiation, and heat conductivity are analyzed for Pulsed-Bias Arc Ion Plating (PBAIP). The wave profile of the pulsed bias voltage, varying from −1000 to 0 V, is basically rectangle. This characteristic periodic energy input has an average energy density being equal to the product of that of the DC Arc Ion Plating (DCAIP) and the duty cycle in PBAIP. A temperature model based on energy conservation for the substrate temperature is thus established, which incorporates input ion power, heat radiation and heat conductivity. Experiments are also conducted to verify the calculation.</description><subject>Arc ion plating</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Materials science</subject><subject>Other topics in materials science</subject><subject>Physics</subject><subject>Pulsed bias</subject><subject>Substrate temperature</subject><issn>0257-8972</issn><issn>1879-3347</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNqFkEtLxDAQgIMouK7-BelFb61Jm-fNZfEFCx7Uc0jTiWTptjVpBf-9KbvicWFghplvZuBD6JrggmDC77ZFnIKzvRmLEmNaYJGCnqAFkULlVUXFKVrgkolcKlGeo4sYtxhjIhRdoNXbVMcxmBGyEXYDpGoKkFnT2qk1o--7zPUhG6Y2QpPV3sTMBJvN_WGed5-X6MyZNL065CX6eHx4Xz_nm9enl_Vqk1tK2ZgDE1I0CjPHKQcsMTHWMUlqxQS1gkLtaksa1zBjnKIlKy0vneNESSqdtNUS3e7vDqH_miCOeuejhbY1HfRT1KXihFUVOQ5KphKJE8j3oA19jAGcHoLfmfCjCdazWr3Vf2r1rFZjkYKmxZvDBxOTKRdMZ3383-ZcUVrKxN3vOUhevj0EHa2HzkLjA9hRN70_9uoXX9OTUQ</recordid><startdate>20050501</startdate><enddate>20050501</enddate><creator>Guoqiang, Lin</creator><creator>Xiao, Bai</creator><creator>Chuang, Dong</creator><creator>Lishi, Wen</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><scope>7TB</scope><scope>FR3</scope></search><sort><creationdate>20050501</creationdate><title>Substrate temperature calculation for pulsed bias arc ion plating</title><author>Guoqiang, Lin ; Xiao, Bai ; Chuang, Dong ; Lishi, Wen</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c445t-e5787d905f646e0801acf581b9574c74ebfbc1dfd5aaf94252c62ff619848f8c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Arc ion plating</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Exact sciences and technology</topic><topic>Materials science</topic><topic>Other topics in materials science</topic><topic>Physics</topic><topic>Pulsed bias</topic><topic>Substrate temperature</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Guoqiang, Lin</creatorcontrib><creatorcontrib>Xiao, Bai</creatorcontrib><creatorcontrib>Chuang, Dong</creatorcontrib><creatorcontrib>Lishi, Wen</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Engineering Research Database</collection><jtitle>Surface &amp; coatings technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Guoqiang, Lin</au><au>Xiao, Bai</au><au>Chuang, Dong</au><au>Lishi, Wen</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Substrate temperature calculation for pulsed bias arc ion plating</atitle><jtitle>Surface &amp; coatings technology</jtitle><date>2005-05-01</date><risdate>2005</risdate><volume>194</volume><issue>2</issue><spage>325</spage><epage>329</epage><pages>325-329</pages><issn>0257-8972</issn><eissn>1879-3347</eissn><coden>SCTEEJ</coden><abstract>The main factors influencing substrate temperature such as ion bombardment, heat radiation, and heat conductivity are analyzed for Pulsed-Bias Arc Ion Plating (PBAIP). The wave profile of the pulsed bias voltage, varying from −1000 to 0 V, is basically rectangle. This characteristic periodic energy input has an average energy density being equal to the product of that of the DC Arc Ion Plating (DCAIP) and the duty cycle in PBAIP. A temperature model based on energy conservation for the substrate temperature is thus established, which incorporates input ion power, heat radiation and heat conductivity. Experiments are also conducted to verify the calculation.</abstract><cop>Lausanne</cop><pub>Elsevier B.V</pub><doi>10.1016/j.surfcoat.2004.07.074</doi><tpages>5</tpages></addata></record>
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subjects Arc ion plating
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Materials science
Other topics in materials science
Physics
Pulsed bias
Substrate temperature
title Substrate temperature calculation for pulsed bias arc ion plating
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T01%3A12%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Substrate%20temperature%20calculation%20for%20pulsed%20bias%20arc%20ion%20plating&rft.jtitle=Surface%20&%20coatings%20technology&rft.au=Guoqiang,%20Lin&rft.date=2005-05-01&rft.volume=194&rft.issue=2&rft.spage=325&rft.epage=329&rft.pages=325-329&rft.issn=0257-8972&rft.eissn=1879-3347&rft.coden=SCTEEJ&rft_id=info:doi/10.1016/j.surfcoat.2004.07.074&rft_dat=%3Cproquest_cross%3E29615331%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=28591530&rft_id=info:pmid/&rft_els_id=S0257897204005973&rfr_iscdi=true