As-grown p-type GaN growth by dimethylhydrazine nitrogen precursor

A new method for the as-grown p-type GaN layer is reported by employing dimethylhydrazine as a new nitrogen precursor. The results of SIMS and Hall-effect measurement show that the hole concentration and mobility of the as-grown p-type GaN are higher than those of the post-activated conventional p-G...

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Veröffentlicht in:Journal of crystal growth 2004-12, Vol.272 (1), p.426-431
Hauptverfasser: Park, Eun-Hyun, Park, Joong-Seo, Yoo, Tae-Kyung
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Sprache:eng
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