Recent advances in insulated gate bipolar transistor technology
Device design of the insulated gate bipolar transistor (IGBT) has been optimized to reduce the distributed transmission-line effect. In addition, cell geometry is chosen to yield high latchup current capability and low forward-voltage drop simultaneously. The vertical structure is optimized to enhan...
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Veröffentlicht in: | IEEE transactions on industry applications 1990-09, Vol.26 (5), p.831-834 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Device design of the insulated gate bipolar transistor (IGBT) has been optimized to reduce the distributed transmission-line effect. In addition, cell geometry is chosen to yield high latchup current capability and low forward-voltage drop simultaneously. The vertical structure is optimized to enhance both the turn-off speed and the safe operating area of the IGBTs. The turn-off time of the n-IGBT has been shortened to be as low as 40 ns. The p-channel IGBT latchup current has been improved four to six times over the previously reported results through innovative design and processes. An open-base bipolar transistor model has been implemented to investigate transient IGBT characteristics.< > |
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ISSN: | 0093-9994 1939-9367 |
DOI: | 10.1109/28.60048 |