Recent advances in insulated gate bipolar transistor technology

Device design of the insulated gate bipolar transistor (IGBT) has been optimized to reduce the distributed transmission-line effect. In addition, cell geometry is chosen to yield high latchup current capability and low forward-voltage drop simultaneously. The vertical structure is optimized to enhan...

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Veröffentlicht in:IEEE transactions on industry applications 1990-09, Vol.26 (5), p.831-834
Hauptverfasser: Yilmaz, H., Owyang, K., Chang, M.F., Benjamin, J.L., Van Dell, W.R.
Format: Artikel
Sprache:eng
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Zusammenfassung:Device design of the insulated gate bipolar transistor (IGBT) has been optimized to reduce the distributed transmission-line effect. In addition, cell geometry is chosen to yield high latchup current capability and low forward-voltage drop simultaneously. The vertical structure is optimized to enhance both the turn-off speed and the safe operating area of the IGBTs. The turn-off time of the n-IGBT has been shortened to be as low as 40 ns. The p-channel IGBT latchup current has been improved four to six times over the previously reported results through innovative design and processes. An open-base bipolar transistor model has been implemented to investigate transient IGBT characteristics.< >
ISSN:0093-9994
1939-9367
DOI:10.1109/28.60048