Rapid chemical state analysis in air by highly sensitive high-resolution PIXE using a v. Hamos crystal spectrometer

Rapid chemical state analysis in air by highly sensitive high-resolution PIXE using a v. Hamos crystal spectrometer

A high‐resolution PIXE system composed of a curved crystal and a position‐sensitive proportional counter in v. Hamos geometry was constructed for rapid chemical state analysis in air. Data processing software to measure the time variation of PIXE spectra was installed in the system. The system was a...

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Veröffentlicht in:X-ray spectrometry 2005-07, Vol.34 (4), p.389-392
Hauptverfasser: Maeda, Kuniko, Hasegawa, Kenichi, Maeda, Masaru, Ogiwara, Kiyoshi, Hamanaka, Hiromi
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Analytical chemistry
Chemistry
Exact sciences and technology
Spectrometric and optical methods
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container_end_page 392
container_issue 4
container_start_page 389
container_title X-ray spectrometry
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creator Maeda, Kuniko
Hasegawa, Kenichi
Maeda, Masaru
Ogiwara, Kiyoshi
Hamanaka, Hiromi
description A high‐resolution PIXE system composed of a curved crystal and a position‐sensitive proportional counter in v. Hamos geometry was constructed for rapid chemical state analysis in air. Data processing software to measure the time variation of PIXE spectra was installed in the system. The system was applied to obtain time‐resolved spectra of sulfur Kβ on the minute time‐scale. Time‐dependent variation of the fine structure was recognized clearly in the S Kβ spectra obtained from marine sediment samples. Copyright © 2005 John Wiley & Sons, Ltd.
doi_str_mv 10.1002/xrs.853
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Spectrometric and optical methods
title Rapid chemical state analysis in air by highly sensitive high-resolution PIXE using a v. Hamos crystal spectrometer
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