Rapid chemical state analysis in air by highly sensitive high-resolution PIXE using a v. Hamos crystal spectrometer

A high‐resolution PIXE system composed of a curved crystal and a position‐sensitive proportional counter in v. Hamos geometry was constructed for rapid chemical state analysis in air. Data processing software to measure the time variation of PIXE spectra was installed in the system. The system was a...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	X-ray spectrometry 2005-07, Vol.34 (4), p.389-392
Hauptverfasser:	Maeda, Kuniko, Hasegawa, Kenichi, Maeda, Masaru, Ogiwara, Kiyoshi, Hamanaka, Hiromi
Format:	Artikel
Sprache:	eng
Schlagworte:	Analytical chemistry Chemistry Exact sciences and technology Spectrometric and optical methods
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	A high‐resolution PIXE system composed of a curved crystal and a position‐sensitive proportional counter in v. Hamos geometry was constructed for rapid chemical state analysis in air. Data processing software to measure the time variation of PIXE spectra was installed in the system. The system was applied to obtain time‐resolved spectra of sulfur Kβ on the minute time‐scale. Time‐dependent variation of the fine structure was recognized clearly in the S Kβ spectra obtained from marine sediment samples. Copyright © 2005 John Wiley & Sons, Ltd.
ISSN:	0049-8246 1097-4539
DOI:	10.1002/xrs.853