Optical XAFS of ZnO Nanowires at the Zn K-Edge and Related Phenomena

We report x-ray excited optical luminescence (XEOL) from one-dimensional nanostructures of ZnO excited with photon energies across the Zn K-edge. The optical luminescence shows an UV and a green emission band characteristic of near band edge and defect emission, respectively. The optical channels we...

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Hauptverfasser: Heigl, Franziskus, Sun, X H Jeff, Lam, Simone, Sham, Tsun-Kong, Gordon, Robert, Brewe, Dale, Rosenberg, Richard, Shenoy, Gopal, Yablonskikh, Mikhail, MacNaughton, Janay, Moewes, Alex
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:We report x-ray excited optical luminescence (XEOL) from one-dimensional nanostructures of ZnO excited with photon energies across the Zn K-edge. The optical luminescence shows an UV and a green emission band characteristic of near band edge and defect emission, respectively. The optical channels were used in turn to monitor the Zn K-edge XAFS to high k values. The densities of states of oxygen character in the valence band were also studied with x-ray emission spectroscopy (XES). The Zn K-edge decay dynamics was examined with time-resolved x-ray excited optical luminescence.
ISSN:0094-243X
DOI:10.1063/1.2644646