Processing of infrared spectra from porous silicon using automatic algorithm {/giflibrary/18/ > ProSpect-2

Here we describe a new algorithm of processing the optical spectra acquired from thin film samples, with emphasis to the infrared reflection-absorption spectra of porous silicon layers. A software package ProSpect-2 makes possible to remove oscillatory component of the spectra associated with interference fringes in fully automatic mode, thus essentially increasing the informative capability of IR spectra. It works in semiautomatic mode and fits experimental data with a batch of several sinusoidal signals slightly different in their frequencies (