Characterisation of PZT thin film micro-actuators using a silicon micro-force sensor

This paper reports on the measurements of displacement and blocking force of piezoelectric micro-cantilevers. The free displacement was studied using a surface profiler and a laser vibrometer. The experimental data were compared with an analytical model which showed that the PZT thin film has a Youn...

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Veröffentlicht in:Sensors and actuators. A. Physical. 2007-01, Vol.133 (1), p.35-44
Hauptverfasser: Duval, Fabrice F.C., Wilson, Stephen A., Ensell, Graham, Evanno, Nicolas M.P., Cain, Markys G., Whatmore, Roger W.
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Sprache:eng
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Zusammenfassung:This paper reports on the measurements of displacement and blocking force of piezoelectric micro-cantilevers. The free displacement was studied using a surface profiler and a laser vibrometer. The experimental data were compared with an analytical model which showed that the PZT thin film has a Young's modulus of 110 GPa and a piezoelectric coefficient d 31,f of 30 pC/N. The blocking force was investigated by means of a micro-machined silicon force sensor based on the silicon piezoresistive effect. The generated force was detected by measuring a change in voltage within a piezoresistors bridge. The sensor was calibrated using a commercial nano-indenter as a force and displacement standard. Application of the method showed that a 700 μm long micro-cantilever showed a maximum displacement of 800 nm and a blocking force of 0.1 mN at an actuation voltage of 5 V, within experimental error of the theoretical predictions based on the known piezoelectric and elastic properties of the PZT film.
ISSN:0924-4247
1873-3069
DOI:10.1016/j.sna.2006.03.035