Interaction between solid surfaces in a polymer melt studied by atomic force microscopy

Using an atomic force microscope (AFM) the interaction between an AFM tip and a planar silicon oxide surface has been measured across poly(dimethylsiloxane) (PDMS, M W = 18 000). Due to the small radius of curvature of the AFM tip the hydrodynamic repulsion of the tip was negligible and forces could be measured in equilibrium. This is confirmed by the fact that force-versus-distance curves measured at different approaching velocities were indistinguishable. In equilibrium a repulsive force was observed which could best be described by a power law, F ∝ 1/ d 2.5 where d is the distance.