In-depth analysis of defects of an insulating sample by cathodoluminescence
From the classical cathodoluminescence (CL) model, a new method is developed to carry out an in‐depth analysis of an insulating target luminescent defects. The depth profiling is performed using an electron beam energy variation and consequently a CL excitation range variation. The in‐depth distribu...
Gespeichert in:
| Veröffentlicht in: | Physica status solidi. A, Applications and materials science Applications and materials science, 2006-02, Vol.203 (3), p.591-599 |
|---|---|
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 599 |
|---|---|
| container_issue | 3 |
| container_start_page | 591 |
| container_title | Physica status solidi. A, Applications and materials science |
| container_volume | 203 |
| creator | Renoud, R. Papin, F. Ganachaud, J.-P. Bigarré, J. |
| description | From the classical cathodoluminescence (CL) model, a new method is developed to carry out an in‐depth analysis of an insulating target luminescent defects. The depth profiling is performed using an electron beam energy variation and consequently a CL excitation range variation. The in‐depth distribution of defects is then obtained using numerical algorithms. Different ways are compared and the best method is evaluated by using the experimental results in the literature. The localization of defects is more realistic by using this algorithm compared to classical models. This new model is applied to the localization of subsurface defects in silica glass samples treated with different polishing processes. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim) |
| doi_str_mv | 10.1002/pssa.200521482 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_29422340</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>29422340</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4542-6b37fef835ac8d00e6afc1b52d961200cb0d8efd008ce0c5ddcef3db178778b83</originalsourceid><addsrcrecordid>eNqFUElLxDAULqLgevXci946Zmmb9CjuOC6gIngJafKi0Uxa-zro_Hs7jozePL0P3rfxJckuJSNKCDtoEfWIEVIwmku2kmxQWbKs5LRaXWJC1pNNxFdC8iIXdCO5vIiZhbZ_SXXUYYYe08alFhyY_hvqmPqI06B7H59T1JM2QFrPUqP7l8Y2YTrxEdBANLCdrDkdEHZ-7lbycHpyf3SejW_OLo4Ox5kZQocWNRcOnOSFNtISAqV2htYFs1VJh_6mJlaCGz7SADGFtQYctzUVUghZS76V7C982655nwL2auKHBiHoCM0UFatyxnhOBuJoQTRdg9iBU23nJ7qbKUrUfDM130wtNxsEez_OGo0OrtPRePxViUJIyufG1YL34QPM_nFVt3d3h38zsoXWYw-fS63u3lQpuCjU4_WZur4_fRrL6kod8y_09o4c</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>29422340</pqid></control><display><type>article</type><title>In-depth analysis of defects of an insulating sample by cathodoluminescence</title><source>Wiley Online Library Journals Frontfile Complete</source><creator>Renoud, R. ; Papin, F. ; Ganachaud, J.-P. ; Bigarré, J.</creator><creatorcontrib>Renoud, R. ; Papin, F. ; Ganachaud, J.-P. ; Bigarré, J.</creatorcontrib><description>From the classical cathodoluminescence (CL) model, a new method is developed to carry out an in‐depth analysis of an insulating target luminescent defects. The depth profiling is performed using an electron beam energy variation and consequently a CL excitation range variation. The in‐depth distribution of defects is then obtained using numerical algorithms. Different ways are compared and the best method is evaluated by using the experimental results in the literature. The localization of defects is more realistic by using this algorithm compared to classical models. This new model is applied to the localization of subsurface defects in silica glass samples treated with different polishing processes. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)</description><identifier>ISSN: 1862-6300</identifier><identifier>ISSN: 0031-8965</identifier><identifier>EISSN: 1862-6319</identifier><identifier>DOI: 10.1002/pssa.200521482</identifier><language>eng</language><publisher>Berlin: WILEY-VCH Verlag</publisher><subject>61.72.Hh ; 78.20.Bh ; 78.60.Hk ; Cathodoluminescence, ionoluminescence ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Exact sciences and technology ; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation ; Other luminescence and radiative recombination ; Physics</subject><ispartof>Physica status solidi. A, Applications and materials science, 2006-02, Vol.203 (3), p.591-599</ispartof><rights>Copyright © 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim</rights><rights>2006 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4542-6b37fef835ac8d00e6afc1b52d961200cb0d8efd008ce0c5ddcef3db178778b83</citedby><cites>FETCH-LOGICAL-c4542-6b37fef835ac8d00e6afc1b52d961200cb0d8efd008ce0c5ddcef3db178778b83</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fpssa.200521482$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fpssa.200521482$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,777,781,1412,27905,27906,45555,45556</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17578130$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Renoud, R.</creatorcontrib><creatorcontrib>Papin, F.</creatorcontrib><creatorcontrib>Ganachaud, J.-P.</creatorcontrib><creatorcontrib>Bigarré, J.</creatorcontrib><title>In-depth analysis of defects of an insulating sample by cathodoluminescence</title><title>Physica status solidi. A, Applications and materials science</title><addtitle>phys. stat. sol. (a)</addtitle><description>From the classical cathodoluminescence (CL) model, a new method is developed to carry out an in‐depth analysis of an insulating target luminescent defects. The depth profiling is performed using an electron beam energy variation and consequently a CL excitation range variation. The in‐depth distribution of defects is then obtained using numerical algorithms. Different ways are compared and the best method is evaluated by using the experimental results in the literature. The localization of defects is more realistic by using this algorithm compared to classical models. This new model is applied to the localization of subsurface defects in silica glass samples treated with different polishing processes. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)</description><subject>61.72.Hh</subject><subject>78.20.Bh</subject><subject>78.60.Hk</subject><subject>Cathodoluminescence, ionoluminescence</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Exact sciences and technology</subject><subject>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</subject><subject>Other luminescence and radiative recombination</subject><subject>Physics</subject><issn>1862-6300</issn><issn>0031-8965</issn><issn>1862-6319</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNqFUElLxDAULqLgevXci946Zmmb9CjuOC6gIngJafKi0Uxa-zro_Hs7jozePL0P3rfxJckuJSNKCDtoEfWIEVIwmku2kmxQWbKs5LRaXWJC1pNNxFdC8iIXdCO5vIiZhbZ_SXXUYYYe08alFhyY_hvqmPqI06B7H59T1JM2QFrPUqP7l8Y2YTrxEdBANLCdrDkdEHZ-7lbycHpyf3SejW_OLo4Ox5kZQocWNRcOnOSFNtISAqV2htYFs1VJh_6mJlaCGz7SADGFtQYctzUVUghZS76V7C982655nwL2auKHBiHoCM0UFatyxnhOBuJoQTRdg9iBU23nJ7qbKUrUfDM130wtNxsEez_OGo0OrtPRePxViUJIyufG1YL34QPM_nFVt3d3h38zsoXWYw-fS63u3lQpuCjU4_WZur4_fRrL6kod8y_09o4c</recordid><startdate>200602</startdate><enddate>200602</enddate><creator>Renoud, R.</creator><creator>Papin, F.</creator><creator>Ganachaud, J.-P.</creator><creator>Bigarré, J.</creator><general>WILEY-VCH Verlag</general><general>WILEY‐VCH Verlag</general><general>Wiley-VCH</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>200602</creationdate><title>In-depth analysis of defects of an insulating sample by cathodoluminescence</title><author>Renoud, R. ; Papin, F. ; Ganachaud, J.-P. ; Bigarré, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4542-6b37fef835ac8d00e6afc1b52d961200cb0d8efd008ce0c5ddcef3db178778b83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>61.72.Hh</topic><topic>78.20.Bh</topic><topic>78.60.Hk</topic><topic>Cathodoluminescence, ionoluminescence</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Exact sciences and technology</topic><topic>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</topic><topic>Other luminescence and radiative recombination</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Renoud, R.</creatorcontrib><creatorcontrib>Papin, F.</creatorcontrib><creatorcontrib>Ganachaud, J.-P.</creatorcontrib><creatorcontrib>Bigarré, J.</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Physica status solidi. A, Applications and materials science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Renoud, R.</au><au>Papin, F.</au><au>Ganachaud, J.-P.</au><au>Bigarré, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>In-depth analysis of defects of an insulating sample by cathodoluminescence</atitle><jtitle>Physica status solidi. A, Applications and materials science</jtitle><addtitle>phys. stat. sol. (a)</addtitle><date>2006-02</date><risdate>2006</risdate><volume>203</volume><issue>3</issue><spage>591</spage><epage>599</epage><pages>591-599</pages><issn>1862-6300</issn><issn>0031-8965</issn><eissn>1862-6319</eissn><abstract>From the classical cathodoluminescence (CL) model, a new method is developed to carry out an in‐depth analysis of an insulating target luminescent defects. The depth profiling is performed using an electron beam energy variation and consequently a CL excitation range variation. The in‐depth distribution of defects is then obtained using numerical algorithms. Different ways are compared and the best method is evaluated by using the experimental results in the literature. The localization of defects is more realistic by using this algorithm compared to classical models. This new model is applied to the localization of subsurface defects in silica glass samples treated with different polishing processes. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)</abstract><cop>Berlin</cop><pub>WILEY-VCH Verlag</pub><doi>10.1002/pssa.200521482</doi><tpages>9</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1862-6300 |
| ispartof | Physica status solidi. A, Applications and materials science, 2006-02, Vol.203 (3), p.591-599 |
| issn | 1862-6300 0031-8965 1862-6319 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_29422340 |
| source | Wiley Online Library Journals Frontfile Complete |
| subjects | 61.72.Hh 78.20.Bh 78.60.Hk Cathodoluminescence, ionoluminescence Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Other luminescence and radiative recombination Physics |
| title | In-depth analysis of defects of an insulating sample by cathodoluminescence |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-20T20%3A44%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=In-depth%20analysis%20of%20defects%20of%20an%20insulating%20sample%20by%20cathodoluminescence&rft.jtitle=Physica%20status%20solidi.%20A,%20Applications%20and%20materials%20science&rft.au=Renoud,%20R.&rft.date=2006-02&rft.volume=203&rft.issue=3&rft.spage=591&rft.epage=599&rft.pages=591-599&rft.issn=1862-6300&rft.eissn=1862-6319&rft_id=info:doi/10.1002/pssa.200521482&rft_dat=%3Cproquest_cross%3E29422340%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=29422340&rft_id=info:pmid/&rfr_iscdi=true |