Influence of the quartz window in a rapid thermal processing apparatus
RTP (Rapid Thermal Processing) is widely used in manufacturing processes in high technology applications. In the present study, a 2D model of a RTP reactor is modified in order to investigate on the quartz window influence on the wafer temperature profile. The numerical calculations are performed in...
Gespeichert in:
Veröffentlicht in: | Journal of Optoelectronics and Advanced Materials 2006-02, Vol.8 (1), p.139-143 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | RTP (Rapid Thermal Processing) is widely used in manufacturing processes in high technology applications. In the present study, a 2D model of a RTP reactor is modified in order to investigate on the quartz window influence on the wafer temperature profile. The numerical calculations are performed in both transient and steady state, using the Monte-Carlo method for solving the radiative heat transfer equation. The absence of quartz window results in better temperature uniformity and in a shorter steady state reaching duration. The influence of the height of the wafer is also evaluated and optimised in steady state. |
---|---|
ISSN: | 1454-4164 |