Buried Linear Extrinsic Defects in Colloidal Photonic Crystals

Buried Linear Extrinsic Defects in Colloidal Photonic Crystals

Linear extrinsic defects can be embedded inside the lattice of a silica colloidal photonic‐crystal film via a directed self‐assembly strategy involving a combination of top–down photolithography and bottom–up colloidal assembly. High‐spatial‐resolution scanning micro‐optical spectroscopy proves to b...

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Veröffentlicht in:Advanced materials (Weinheim) 2005-05, Vol.17 (10), p.1269-1272
Hauptverfasser: Vekris, E., Kitaev, V., von Freymann, G., Perovic, D. D., Aitchison, J. S., Ozin, G. A.
Format: Artikel
Sprache:eng
Schlagworte:
collodial
Lithography
Lithography, photo
photo
Photonic crystals
Photonic crystals, collodial
Self-assembly
Waveguides
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Beschreibung
Zusammenfassung:Linear extrinsic defects can be embedded inside the lattice of a silica colloidal photonic‐crystal film via a directed self‐assembly strategy involving a combination of top–down photolithography and bottom–up colloidal assembly. High‐spatial‐resolution scanning micro‐optical spectroscopy proves to be an effective means of characterizing the photonic crystal properties of the buried defects (see Figure) within the film.
ISSN:0935-9648
1521-4095
DOI:10.1002/adma.200401764