Using neural networks in reliability prediction

It is shown that neural network reliability growth models have a significant advantage over analytic models in that they require only failure history as input and not assumptions about either the development environment or external parameters. Using the failure history, the neural-network model auto...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE software 1992-07, Vol.9 (4), p.53-59
Hauptverfasser: Karunanithi, N., Whitley, D., Malaiya, Y.K.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:It is shown that neural network reliability growth models have a significant advantage over analytic models in that they require only failure history as input and not assumptions about either the development environment or external parameters. Using the failure history, the neural-network model automatically develops its own internal model of the failure process and predicts future failures. Because it adjusts model complexity to match the complexity of the failure history, it can be more accurate than some commonly used analytic models. Results with actual testing and debugging data which suggest that neural-network models are better at endpoint predictions than analytic models are presented.< >
ISSN:0740-7459
1937-4194
DOI:10.1109/52.143107