Gamma Radiation Induced Calibration Shift for Four Cryogenic Thermometer Types

Cryogenic temperature sensors utilized in space environments are exposed to ionizing radiation with the total dose dependent upon the length of the mission. Based upon their minimal size and robust packaging, four models of cryogenic Resistance Thermometer Devices (RTDs) manufactured by Lake Shore Cryotronics, Inc. were tested to determine their reliability for space applications with regard to radiation. Samples of CernoxTM RTDs (CX-1050-SD), ruthenium oxide RTDs (models RX-102A-AA and RX-103A-AA), and silicon diode thermometers (model DT-670-SD) were irradiated at room temperature by a cesium-137 gamma source to total doses ranging from 5 Gy to 10 kGy. This paper presents the resulting temperature shifts induced by the gamma radiation as a function of total dose over the 1.4 K to 325 K temperature range. These data show that 1) CernoxTM RTDs exhibit high radiation hardness to 10 kGy from 1.4 K to 325 K, 2) ruthenium oxide RTDs show moderate radiation hardness to 10 kGy below 10 K, and 3) silicon diodes temperature sensors exhibit some radiation tolerance to low levels of radiation (especially below 70 K), but quickly shift calibration at radiation levels above 300 Gy, especially above 100 K.