Single centre, long-term experience with Mentor Contour Profile Gel Implants. What can we learn after 21 years of follow up?

The difficulty in obtaining long term data with the use of breast implants is well known. The majority of available data are multicentre studies with different surgical techniques, and different implants. We provide a retrospective 10-year study data (2001 to 2011) with Mentor® Contour Profile Gel (CPG TM) implants after a mean of 13 years of follow-up, in the first single-centre study of such size and length. This study included 835 patients with 1674 Mentor implants across six surgery types, all of them operated with a consistent surgical technique developed by the senior author. Long term complication rates were analysed. For the safety analysis, Kaplan-Meier risk rates were calculated. 85% of the patients had long term follow up data (at least 7 years). The overall complication rate was 13,2%. The reoperation rate was 12,3%, being just 6,4% due to complications. The 21-year Kaplan Meier cumulative incidence rate was 1,7% for capsular contracture and 5,7% for implant rupture. Periareolar approach and having a previous capsular contracture were found to be risk factors to develop a new capsular contracture. Low height, high projected implants had a significant higher risk of implant rotation. No BIA-ALCL nor BII cases were found. 89,2% of the patients reported to be satisfied or very satisfied with the surgery and the implant. With a consistent surgical technique, this 21-year follow-up data of the MENTOR ® CPG™ reaffirm the very strong safety profile of these implants, as well as continued patient satisfaction with them.