Silica encapsulation study on SrAl2O4:Eu2+, Dy3+ phosphors
A new chemical precipitation method for silica encapsulation was firstly used in surface treatment of SrAl2O4:Eu2+, Dy3+ phosphors. X-ray fluorescent spectrometer (XRF), FTIR and scanning electron microscopy (SEM) results showed that a dense layer of silica is formed on phosphor surface after being...
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Veröffentlicht in: | Materials chemistry and physics 2005-10, Vol.93 (2-3), p.526-530 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | A new chemical precipitation method for silica encapsulation was firstly used in surface treatment of SrAl2O4:Eu2+, Dy3+ phosphors. X-ray fluorescent spectrometer (XRF), FTIR and scanning electron microscopy (SEM) results showed that a dense layer of silica is formed on phosphor surface after being encapsulated for 2.5h under the condition of pH 10.5 and T=80±1.0°C. Water-resistance and photoluminescence measurement results showed that encapsulation amount and dispersing media play an important role in water-resistance of phosphors. Using glycol as dispersing media and controlling encapsulation amount at 5wt.% would effectively improve water-resistance of SrAl2O4:Eu2+, Dy3+ phosphors at the cost of a minor loss of persistent phosphorescence. |
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ISSN: | 0254-0584 1879-3312 |
DOI: | 10.1016/j.matchemphys.2005.04.002 |