Silica encapsulation study on SrAl2O4:Eu2+, Dy3+ phosphors

A new chemical precipitation method for silica encapsulation was firstly used in surface treatment of SrAl2O4:Eu2+, Dy3+ phosphors. X-ray fluorescent spectrometer (XRF), FTIR and scanning electron microscopy (SEM) results showed that a dense layer of silica is formed on phosphor surface after being...

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Veröffentlicht in:Materials chemistry and physics 2005-10, Vol.93 (2-3), p.526-530
1. Verfasser: Lii, Xingdong
Format: Artikel
Sprache:eng
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Zusammenfassung:A new chemical precipitation method for silica encapsulation was firstly used in surface treatment of SrAl2O4:Eu2+, Dy3+ phosphors. X-ray fluorescent spectrometer (XRF), FTIR and scanning electron microscopy (SEM) results showed that a dense layer of silica is formed on phosphor surface after being encapsulated for 2.5h under the condition of pH 10.5 and T=80±1.0°C. Water-resistance and photoluminescence measurement results showed that encapsulation amount and dispersing media play an important role in water-resistance of phosphors. Using glycol as dispersing media and controlling encapsulation amount at 5wt.% would effectively improve water-resistance of SrAl2O4:Eu2+, Dy3+ phosphors at the cost of a minor loss of persistent phosphorescence.
ISSN:0254-0584
1879-3312
DOI:10.1016/j.matchemphys.2005.04.002