Planar waveguide-resonator: a new device for x-ray optics

Systematic investigations of the width dependence on the x‐ray beam propagation mechanism for a narrow extended slit formed by two plane dielectric plates are presented. It is shown that the mechanism of a multiple consecutive total reflection for Cu Kα radiation dominates in a slit width range s ≥...

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Veröffentlicht in:X-ray spectrometry 2004-09, Vol.33 (5), p.360-371
Hauptverfasser: Egorov, V. K., Egorov, E. V.
Format: Artikel
Sprache:eng
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Zusammenfassung:Systematic investigations of the width dependence on the x‐ray beam propagation mechanism for a narrow extended slit formed by two plane dielectric plates are presented. It is shown that the mechanism of a multiple consecutive total reflection for Cu Kα radiation dominates in a slit width range s ≥ 3 µm. At the same time the manner of Cu Kα radiation propagation for super‐narrow slits s ≤ 0.1 µm is very different from the multiple total reflection mechanism. The x‐ray beam intensity proves to be constant for all this range of magnitude. This gives grounds to expect that the super‐narrow slit area is characterized by a specific type of mechanism of x‐ray beam propagation: waveguide‐resonance. A simple model for the waveguide‐resonance propagation mechanism based on the formation of a uniform x‐ray standing wave interference field in the total space of a narrow extended slit was developed. The design of a new x‐ray optical device, namely a planar x‐ray waveguide‐resonator, is proposed based on the waveguide‐resonance mechanism. Some properties of the composite planar x‐ray waveguide‐resonator are discussed. It is shown that under specific conditions the composite waveguide can demonstrate a partial tunneling effect of the x‐ray beam. The main applications of the new technique are discussed. Copyright © 2004 John Wiley & Sons, Ltd.
ISSN:0049-8246
1097-4539
DOI:10.1002/xrs.735