Anatomical registration of intracranial electrodes. Robust model-based localization and deformable smooth brain-shift compensation methods
Intracranial electrodes are typically localized from post-implantation CT artifacts. Automatic algorithms localizing low signal-to-noise ratio artifacts and high-density electrode arrays are missing. Additionally, implantation of grids/strips introduces brain deformations, resulting in registration...
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Veröffentlicht in: | Journal of neuroscience methods 2024-04, Vol.404, p.110056, Article 110056 |
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Sprache: | eng |
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Zusammenfassung: | Intracranial electrodes are typically localized from post-implantation CT artifacts. Automatic algorithms localizing low signal-to-noise ratio artifacts and high-density electrode arrays are missing. Additionally, implantation of grids/strips introduces brain deformations, resulting in registration errors when fusing post-implantation CT and pre-implantation MR images. Brain-shift compensation methods project electrode coordinates to cortex, but either fail to produce smooth solutions or do not account for brain deformations.
We first introduce GridFit, a model-based fitting approach that simultaneously localizes all electrodes’ CT artifacts in grids, strips, or depth arrays. Second, we present CEPA, a brain-shift compensation algorithm combining orthogonal-based projections, spring-mesh models, and spatial regularization constraints.
We tested GridFit on ∼6000 simulated scenarios. The localization of CT artifacts showed robust performance under difficult scenarios, such as noise, overlaps, and high-density implants ( |
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ISSN: | 0165-0270 1872-678X 1872-678X |
DOI: | 10.1016/j.jneumeth.2024.110056 |