Co-Firing and Shrinkage Matching in Low- and Middle- Permittivity Dielectric Compositions for a Low-Temperature Co-Fired Ceramics System

Co‐firing and shrinkage matching of low‐ and middle‐ permittivity dielectric compositions for the application to a low‐temperature co‐fired ceramics system was investigated. Several glass compositions were initially examined for the low‐temperature firing of middle‐K (K∼20) dielectrics, and their co...

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Veröffentlicht in:Journal of the American Ceramic Society 2006-02, Vol.89 (2), p.562-567
Hauptverfasser: Choi, Young-Jin, Park, Jeong-Hyun, Ko, Won-Jun, Hwang, In-Sung, Park, Jae-Hwan, Park, Jae-Gwan, Nahm, Sahn
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Sprache:eng
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Zusammenfassung:Co‐firing and shrinkage matching of low‐ and middle‐ permittivity dielectric compositions for the application to a low‐temperature co‐fired ceramics system was investigated. Several glass compositions were initially examined for the low‐temperature firing of middle‐K (K∼20) dielectrics, and their compositions were further modified for shrinkage matching between low‐K (K∼6) and middle‐K layers. By controlling the processing parameters such as the solid loading ratio and stacking sequence, the warpages between hetero‐layers could be minimized.
ISSN:0002-7820
1551-2916
DOI:10.1111/j.1551-2916.2005.00748.x