Simulating high-pressure surface reactions with molecular beams
Using a reactive molecular beam with high kinetic energy ( E kin ), it is possible to speed gas-surface reactions involving high activation barriers ( E act ), which would require elevated pressures ( P 0 ) if a random gas with a Maxwell-Boltzmann distribution is used. By simply computing the number...
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Veröffentlicht in: | Physical chemistry chemical physics : PCCP 2024-01, Vol.26 (3), p.177-1776 |
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Sprache: | eng |
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Zusammenfassung: | Using a reactive molecular beam with high kinetic energy (
E
kin
), it is possible to speed gas-surface reactions involving high activation barriers (
E
act
), which would require elevated pressures (
P
0
) if a random gas with a Maxwell-Boltzmann distribution is used. By simply computing the number of molecules that overcome the activation barrier in a random gas at
P
0
and in a molecular beam at
E
kin
=
E
act
, we establish an
E
kin
-
P
0
equivalence curve, through which we postulate that molecular beams are ideal tools to investigate gas-surface reactions that involve high activation energies. In particular, we foresee the use of molecular beams to simulate gas surface reactions within the industrial-range (>10 bar) using surface-sensitive ultra-high vacuum (UHV) techniques, such as X-ray photoemission spectroscopy (XPS). To test this idea, we revisit the oxidation of the Cu(111) surface combining O
2
molecular beams and XPS experiments. By tuning the kinetic energy of the O
2
beam in the range of 0.24-1 eV, we achieve the same sequence of surface oxides obtained in ambient pressure photoemission (AP-XPS) experiments, in which the Cu(111) surface was exposed to a random O
2
gas up to 1 mbar. We observe the same surface oxidation kinetics as in the random gas, but with a much lower dose, close to the expected value derived from the equivalence curve.
Using a reactive molecular beam with high kinetic energy (
E
kin
), it is possible to speed gas-surface reactions involving high activation barriers (
E
act
), which would require elevated pressures if a random gas is used. |
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ISSN: | 1463-9076 1463-9084 |
DOI: | 10.1039/d3cp05071h |