Variable Dielectrics in the Calcium Magnesium Titanate System Characterized with Scanning Microwave Microscopy

Near‐field scanning microwave microscopy (SMM) is used to observe the fine‐scale dielectric phenomena. The purpose of the present study is to apply the SMM to examine the dielectrics in the multiphase CT–MT–M2T system and study the dielectric relative permittivity distribution. SMM clearly resolves...

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Veröffentlicht in:	Journal of the American Ceramic Society 2006-05, Vol.89 (5), p.1610-1614
Hauptverfasser:	Wing, Zachary N., Halloran, John W., Zhang, Qinxin, McGinn, Paul J.
Format:	Artikel
Sprache:	eng
Schlagworte:	Calcium Ceramics Chemical analysis Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Dielectric, piezoelectric, ferroelectric and antiferroelectric materials Dielectrics Dielectrics, piezoelectrics, and ferroelectrics and their properties Electric properties Exact sciences and technology Magnesium Materials science Microscopy Microwave heating Microwaves Niobates, titanates, tantalates, pzt ceramics, etc Phase diagrams and microstructures developed by solidification and solid-solid phase transformations Phase diagrams of other materials Physics Scanning Scanning electron microscopy Tables
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Beschreibung
Zusammenfassung:	Near‐field scanning microwave microscopy (SMM) is used to observe the fine‐scale dielectric phenomena. The purpose of the present study is to apply the SMM to examine the dielectrics in the multiphase CT–MT–M2T system and study the dielectric relative permittivity distribution. SMM clearly resolves the three‐phase distribution and is in agreement with chemical analysis.
ISSN:	0002-7820 1551-2916
DOI:	10.1111/j.1551-2916.2006.00962.x