Technology of superconducting thin films on Si, SiO(2), and Si(3)N(4) for vacuum microelectronics

A study of YBaCuO films on Si, SiO(2), and Si(3)N(4) substrates demonstrates that rapid thermal processing can suppress the film-substrate reaction during the postgrowth oxygen annealing. By increasing the copper content of YBaCuO films that are sputter-deposited on SiO(2)/Si to correspond to the 1:...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on electron devices 1989-11, Vol.36 (11), p.2693-2696
Hauptverfasser: Aslam, M, Soltis, R E, Logothetis, E M, Chase, R E, Wenger, L E, Chen, J T
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A study of YBaCuO films on Si, SiO(2), and Si(3)N(4) substrates demonstrates that rapid thermal processing can suppress the film-substrate reaction during the postgrowth oxygen annealing. By increasing the copper content of YBaCuO films that are sputter-deposited on SiO(2)/Si to correspond to the 1:2:3 metal composition, the authors have achieved an onset of superconductivity above 95 K and a Tc(0) above 70 K through a rapid oxygen anneal for 6 s at 940 degrees C without a nitrogen preanneal. These results as well as results of others suggest that high Tc oxide superconductors could be used as electron sources or as cold emitters, gates, and collectors.
ISSN:0018-9383
DOI:10.1109/16.43774