Ray Based Model for the Ultrasonic Time-of-Flight Diffraction Simulation of Thin Walled Structure Inspection

Ray Based Model for the Ultrasonic Time-of-Flight Diffraction Simulation of Thin Walled Structure Inspection

It is necessary to size the cracklike defects accurately in order to extend the life of thin-walled (

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Veröffentlicht in:Journal of pressure vessel technology 2005-08, Vol.127 (3), p.262-268
Hauptverfasser: Baskaran, G, Balasubramaniam, K, Krishnamurthy, C. V, Rao, C. Lakshmana
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container_end_page 268
container_issue 3
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container_title Journal of pressure vessel technology
container_volume 127
creator Baskaran, G
Balasubramaniam, K
Krishnamurthy, C. V
Rao, C. Lakshmana
description It is necessary to size the cracklike defects accurately in order to extend the life of thin-walled (
doi_str_mv 10.1115/1.1989353
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title Ray Based Model for the Ultrasonic Time-of-Flight Diffraction Simulation of Thin Walled Structure Inspection
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